Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility
The IVEM-Tandem Facility is a user facility supported by the U.S. Department of Energy-Office of Nuclear Energy (DOE-NE) for in situ TEM studies of defect structures in materials under controlled ion irradiation and sample conditions.
Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility at Argonne National Laboratory. User Chris Ulmer, graduate student from Penn State University, performs research at IVEM-Tandem. | Get photo
The IVEM-Tandem facility is unique in the United States and is one of only five in the world. It is unique in its ability to image the changes in atomic structure and defect formation during irradiation at high magnification. The IVEM's important advantages include:
- Real Time observation of defect formation and evolution during irradiation.
- Well-controlled experimental conditions (constant specimen orientation and area, specimen temperature, ion type, ion energy, dose rate, dose, and applied strain).
- Refine and validate computer model simulations of irradiation defect states.
- High-dose ion damage is produced in hours, rather than the years such damage would require in a nuclear reactor, supporting studies of material response to high doses of particle (ion and neutron) irradiation.
- In situ ion irradiation does not produce any radioactivity in samples.
Irradiation Defect Dynamics in Fe
Please wait until video loads completely.
Live Closed captioning not available for this video.
Problems viewing the video? Contact
Watch this video on YouTube: Irradiation Defect Dynamics in Fe
In situ movie of defect formation, motion, and coalescence to form extended dislocation structures in Fe under ion irradiation. These structures lead to degradation of the mechanical properties in irradiated metals.
M.Hernandez-Mayoral, Z. Yao, M. Jenkins, M. Kirk, “Heavy-ion irradiations of Fe and Fe-Cr model alloys Part 2: Damage evolution in thin-foils at higher doses,” Phil Mag 88(21), 2881 (2008).
Last Modified: Thu, April 21, 2016 3:37 AM