Nuclear Engineering Division

Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility

TEM Equipment and Capabilities

The IVEM interfaces with an ion beamline incident from above at 30° to the electron beam, allowing in situ irradiations during observation under controlled sample and diffracting conditions.

Irradiation defects in Mo in 3D

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Watch this video on YouTube: Irradiation defects in Mo in 3D

Movie of interstitial dislocation loops formed in Mo by 1 MeV Kr ion irradiation at 80°C, rotating in 3D and produced by reconstruction of tomographic data while maintaining constant diffraction condition.

Meimei Li, M.A. Kirk, P.M. Baldo, Donghua Xu, and B. D. Wirth, “Study of Defect Evolution by TEM with in situ Ion Irradiation and Coordinated Modelling,” Phil Mag. 92 (2012) 2048.


IVEM-Tandem equipment includes:

  • Hitachi-9000 with side-entry sample stages.
    • Range of electron energies of 100 to 300 keV.
    • Range of total electron currents from a LaB6 filament of 10 to 200 nA.
  • Gatan OneViewTM digital camera for high resolution data acquisition and at up to 200 frames/sec video recording with in situ specimen conditions.

Sample Stages for in situ TEM

  • Double-tilt High Temperature (20-900°C), 3 mm disk or FIB specimens.
  • Single-tilt High Temperature (20-1100°C), 3 mm disk or FIB specimens.
  • Double-tilt Low Temperature (20-300 K), 3 mm disk or FIB specimens.
  • Single-tilt Heating-Straining (20-600°C), 11x3 mm strip specimen.
  • Double-tilt Rotate (20°C), 3 mm disk or FIB specimens.

In Situ Capabilities

  • Continuous recording of image with in situ specimen conditions of ion dose, temperature and strain.
  • Oil-free microscope vacuum of 5x10-8 torr enables transmission electron microscopy (TEM) of Fe samples at 600°C free of contamination and oxidation.
  • Sample stages for in situ irradiation include control of sample temperature to ±3C° over a range of 20 K to 1100°C.
  • Mechanical stability of the sample at temperature and during irradiation allows a point resolution of 0.25 nm at 300 keV electron energy; with good sample quality, small defect clusters, dislocation loops, and voids/bubbles are resolvable down to a limit of 1-nm diameter.
  • Sample straining stage allows in situ experiments with samples under irradiation and stress at temperatures up to 600°C.
  • Three-rotation-axes sample stage (double-tilt rotate) allows a relatively easy tomography measurement (±40° tilting) for imaging of defects and microstructure in 3D maintaining constant diffraction conditions.

Last Modified: Mon, September 12, 2016 11:47 AM

Submit a proposal to use IVEM-Tandem

NSUF Call for Rapid Turnaround Experiment (RTE) Proposals due on February 28, 2018.

Interested in Availability?

IVEM-Tandem Calendar

Check the IVEM-Tandem Calendar for availability, and read instructions on how to submit a proposal.


Scientific Playgrounds Accelerating Clean Energy Research Department of Energy user facilities, such as Argonne's Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility, provide extraordinary resources integral to many Energy Frontier Research Center scientific breakthroughs…Read full story »

Useful Resources

Workshop on Transmission Electron Microscopy Characterization of Irradiation Induced Defects, Argonne National Laboratory, Sept. 3-5, 2014.

Contact Us

  • Questions about IVEM-Tandem?
    Email us at or call us at 1-630-252-5222 or 1-630-252-5111.