Nuclear Engineering Division

Intermediate Voltage Electron Microscopy (IVEM) Facility

Workshop on Transmission Electron Microscopy Characterization of Irradiation Induced Defects

Best Practices Working Group for the University of Michigan IRP
Argonne National Laboratory, Sept. 3-5, 2014

Workshop on Transmission Electron Microscopy Characterization of Irradiation Induced Defects

A workshop on the characterization of radiation damage in metals using transmission electron microscopy was held at Argonne National Laboratory from September 3-5, 2014. The workshop was organized by Mark Kirk of Argonne National Laboratory and Arthur Motta from Penn State University, under the aegis of a DOE-sponsored Integrated Research Project aimed at using ion irradiation to study the response of advanced fuel cladding materials to high doses of neutron irradiation.

The main objective of the workshop was to agree on a set of best practices for the quantification of radiation damage using transmission electron microscopy (TEM). Extensive TEM examinations of irradiated materials are to be performed in this project, which includes samples irradiated with both ions (protons and heavy ions) and neutrons on a variety of metallic alloys and irradiation conditions, and using both for bulk irradiations and in situ irradiation of thin foils. Given the task, it is crucial that the research groups involved use a common set of best practices that minimizes artifacts and allows for reliable quantification and identification of defects and comparison of data between laboratories.

The workshop was opened by Mark Peters, the Associate Laboratory Director for the Energy and Global Security Directorate, and included a ceremony of rededication of the Intermediate Voltage Electron Microscope (IVEM), a world-class facility at Argonne for which DOE-NE funding has been found this year. The ceremony was presided by Al Sattelberger, Deputy Laboratory Director for Programs and attended by many of the principals responsible for creating the IVEM.

Forty researchers from 14 different institutions in the US, Canada and Great Britain attended the workshop, in which talks were presented on defect imaging techniques, counting procedures and statistics, and various techniques for sample preparation as well as hands-on demonstrations of the Intermediate Voltage Electron Microscope (IVEM), a talk and tour of the Advanced Photon Source and talks on XMAT.

The participants then wrote contributions to the workshop report. The product of the workshop presentations and discussions, now being gathered by the two organizers, will be a set of best practices, envisioned as a living document that will be shared with all the participants who can then use the same methods in their studies. This will also allow us to understand the differences between various sample types and preparation methods.

Last Modified: Mon, September 29, 2014 10:05 AM

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Workshop on Transmission Electron Microscopy Characterization of Irradiation Induced Defects, Argonne National Laboratory, Sept. 3-5, 2014.

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